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March 3, 2026MetrologiaOpen Access

Degradation characterization of induced junction photodiodes under ultraviolet irradiation

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AKAarre Viljami KilpeläinenAalto UniversityFMFarshid ManoocheriAalto UniversityFEFredrik EdhborgRISE Research Institutes of Sweden

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Kilpeläinen et al. (2026) studied this question.

synapsesocial.com/papers/6aaa5ca4d0a3c768807e67e9https://doi.org/10.1088/1681-7575/ae4c8f
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