Analytical study demonstrates high-precision silicon isotope measurement using critical mixture double-spiking, highlighting a fourfold improvement in long-term reproducibility.
We developed critical mixture double-spiking Si isotope measurement, achieving an enhanced long-term reproducibility of ±0.03‰ ( δ 30 Si, 2 s.d.), which is ∼4 times better than the current methods' long-term reproducibility over ±0.1‰ ( δ 30 Si, 2 s.d.).
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Liu et al. (2024) studied this question.
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