We have investigated the electronic structure of GaInN semiconductors by performing x-ray absorption near-edge fine structure (XANES) spectroscopy at Ga K-edge and self-consistent-field real-space multiple-scattering theory calculations. It was demonstrated that the nondestructive Ga K-edge XANES spectra can be used as the fingerprints of structure and composition for GaInN. The theoretical calculations gave a reasonable reproduction of the experimental spectral features. The results revealed that the combination of the experimental XANES and the theoretical calculations is a powerful tool for studying the electronic structure of GaInN semiconductors.
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Guo et al. (2011) studied this question.
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