Oxygen Transport at the LaMnO[sub 3] Film/Yttria-Stabilized Zirconia Interface under Different Cathodic Overpotentials by Secondary Ion Mass Spectrometry

Oxygen transport under different cathodic overpotentials was investigated at the stabilized interface. A stable isotope oxygen was adopted as a diffusion marker at 1073 K under cathodic polarization, and the quenched samples were analyzed by secondary ion mass spectrometry. The diffusion profiles indicate the higher diffusivity of in film with the higher cathodic overpotentials. The introduction of oxygen vacancies by the cathodic polarization can change the diffusion profiles of in the film. The diffusion profiles of oxygen in film under the cathodic polarization were calculated from the literature data of oxygen content in as a first estimation. The calculated diffusion profiles showed a similar trend with the measured ones, but different concentration in the film under the higher polarization.