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The tangentially viewing visible and vertically viewing infrared camera systems on DIII-D were upgraded to permit emission measurements during edge localized modes (ELMs) with integration times as short as 1 and 100 μs, respectively. The visible system was used to obtain two-dimensional poloidal profiles of CIII (465 nm) and Dα (656.3 nm) emission with 20 μs integration during various stages of ELM events in the lower DIII-D divertor. The infrared system was used to measure the heat flux to the divertor targets at 10 kHz with 100 μs exposure. Upgrades to the data processing and storage systems permitted efficient comparison of the temporal evolution of these measurements.
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Groth et al. (2003) studied this question.
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