Enhanced millimeter wave transmission through a subwavelength slot placed into a corrugated conducting wafer, using perfect conductor model, is experimentally observed compared with the case of the single isolated slot. The corrugated wafer responds in a similar way as in the optical regime, in which a surface plasmon model is employed to describe the metal. Experimental results of the enhanced transmission and reflection of the corrugated wafer have been measured by using a quasioptical vector network analyzer. Future applications of enhanced subwavelength transmission in quasioptical devices are envisaged.
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Beruete et al. (2005) studied this question.
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