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A multianode microchannel-plate (MCP) detector was operated in a transverse magnetic field. When a collimated ion beam of ∼4 mm diameter impinged on one area of the plate, ghost images were observed elsewhere on the plate at anodes up to several centimeters from the beam spot. This effect is due to secondary electrons which are emitted from the interstitial surfaces around the MCP pores and returned to the surface of the plate under the influence of E×B fields, where E is the electric field perpendicular to the plate due to the MCP bias potential and B is the externally applied transverse magnetic field. A regenerative process is observed in which the secondary electrons traverse the surface of the plate in the E×B direction by successive gyro-orbit steps. A method for suppressing the ghost images is discussed.
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Roquemore et al. (1986) studied this question.
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