Answers are grounded in this paper and cite their sources.
Concepts of effective sensitive area and effective SET pulse width are proposed to model the actual sensitive area. Simulation results present that the soft error vulnerabilities got by using the effective sensitive area can be almost an order larger than the ones got by using the normal approach when the ion LET is 30 MeV ·cm2/mg. And heavy-ion experiments are conducted to demonstrate the simulation results.
No takes yet. Share an insight, caveat, or question.
Chen et al. (2014) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: