We derived a temperature-dependent Sellmeier equation for Al(x)Ga(1-x)As material by measuring the refractive index of GaAs and AlAs with temperature dependence in a resonant cavity enhanced structure. The equation is applicable in the range of 1460-1580 nm and 26-86 degrees C and can be extrapolated to the other wavelengths and temperature ranges as well.
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Kim et al. (2007) studied this question.
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