Surface-structure determinations by means of off-normal photoelectron diffraction: A kinematical analysis

Recent off-normal photoelectron diffraction data of Barton et al. for c(2×2)S on Ni(001) and p(2×2)S on Cu(001) are analyzed using a single-scattering cluster model. The χ(E) curves and their Fourier transforms (FT's) are sufficiently well predicted by this model to permit a detailed analysis of the origins of the FT peaks. No simple connection of these peaks with single nearest-neighbor substrate path-length differences is possible, in contrast with a prior analysis of the same data.