Subsurface nano-imaging with self-assembled spherical cap optical nanoscopy

Frequently-used subsurface nano-imaging techniques have limitations in interference, stability, complexity, timeliness and cost reduction on account of the combination of excited ultrasound signal or probed cantilever tip. Though some improved optical methods can directly and visually obtain subsurface nanofeatures, the high refractive index difference (RID) between introduced superlens and subsurface object will inevitably degenerate the image quality. In this paper, a simple and reliable experimental technique is presented to self-assemble spherical cap optical nanoscopy (SCON) subsurface nano-imaging system (SNIS) with two low RID materials. By using SCON-SNIS, subsurface objects with a spacing as small as 0.16 times of illumination wavelength, and involving wider field of views (nearly one-half of SCON's great-circle diameter in the direction of the equator) and deeper depth (several micrometers) can be imaged. In order to get insights into the imaging mechanism, a finite element simulation and a ray-optics analytical study are performed, in which the imaging process is elucidated both theoretically and experimentally. This non-invasive, label-free and real-time subsurface nano-imaging paradigm could be a promising tool in life, material, biology and engineering sciences.