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The dependence of the secondary-ion yield Y on the energy loss dE/dx of fast (MeV/u) primary ions has been measured for organic and inorganic samples. It is found that the dependence of Y on dE/dx can be expressed in the whole dE/dx range investigated (1{≤}dE/dx{≤}54 keV {μ}g^-1 cm²) as Y{∝}(dE/dx-S)ⁿ, where S is a threshold energy loss. Different exponents n exist for positive and negative secondary ions as well as ions desorbed from different samples.
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Brandl et al. (1991) studied this question.
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