Total ionizing dose experiments showed an increase in operating frequency (and therefore, power consumption) in bulk CMOS ring oscillators when operated at ultra-low power supply voltages. Combined-environment experiments showed the single-event susceptibility of ULP circuits increases with total dose exposure. To operate ULP circuits in a total dose environment and ensure there is little change in their circuit characteristics, the supply voltage should be greater than 400 mV.
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Casey et al. (2009) studied this question.
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