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Multilayer piezo stack based on Na0,5Bi4,5Ti4O15 was produced by tape casting slurry technology. X-ray diffraction, dielectric permittivity, piezoelectric and pyroelectric studies have been performed on the specimens. It was established that specimens have a textured structure due to the orientation of basal planes (001) plate-like grains parallel to the direction of film casting. The Curie point (Tc = 645 °C) of the obtained stacks have been determined from the temperature-frequency dependences of the dielectric permittivity and loss tangent, it is established that they have a relatively high effective piezoelectric constant (d33*= 180 pC/N) for NBT based ceramic system. In concluding it has been analyzed the prospect of the specimens in high temperature applications.
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Спицин et al. (2019) studied this question.
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