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December 1, 2007IEEE Transactions on Nuclear Science

Impact of Total Ionizing Dose on the Analog Single Event Transient Sensitivity of a Linear Bipolar Integrated Circuit

M. F. Bernard L. Dusseau S. Büchner Dale McMorrow R. Ecoffet J. Boch J.-R. Vaillé Ronald D. Schrimpf Kenneth A. LaBel

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Abstract

Total ionizing dose (TID) strongly affects the Single Event Transient (SET) sensitivity of a bipolar linear voltage comparator (LM139).

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Cite This Study

Bernard et al. (2007) studied this question.

synapsesocial.com/papers/6aae493203b701175ecc689d https://doi.org/10.1109/tns.2007.910229

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Keep reading

Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

1Analysis of single-event transients in analog circuitsOriginal Research · 2000 · 153 citations
2Analysis of Bias Effects on the Total-Dose Response of a Bipolar Voltage ComparatorOriginal Research · 2006 · 20 citations
3Analysis of Total-Dose Response of a Bipolar Voltage Comparator Combining Radiation Experiments and Design DataOriginal Research · 2006 · 18 citations
4Application of a pulsed laser for evaluation and optimization of SEU-hard designs [CMOS]Original Research · 2000 · 154 citations
5Total dose effects in a linear Voltage regulatorOriginal Research · 2004 · 45 citations

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Single-Event Transients in Bipolar Linear Integrated Circuits2006
Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation2002
Total dose effects in conventional bipolar transistors and linear integrated circuits1994

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