Large-Batch Testing Methodology for Compliance to Low Destructive SEE Cross-Sections in Accelerator Control Systems

The reliability of CERN control systems, including power converters, radio frequency (RF) systems, and safety electronics, is essential for LHC operation. With the high-luminosity LHC (HL-LHC) update, the increased radiation levels combined with very low tolerated system failure rates translate into extremely stringent upper-limit destructive single event effect (SEE) cross-sections. Ensuring compliance under these conditions is challenging due to the extremely low device cross-sections and the large number of potentially sensitive components per system. This article presents a methodology that first derives part-level SEE cross-section targets from system-level requirements, taking into account operational conditions such as system failure rates and radiation levels at their installation locations. In a second stage, these part cross-sections are used to calculate large-batch test plans, determining the number of devices required to demonstrate compliance with the SEE targets. The tests are performed using a dedicated CHARM facility structure, designed to accommodate high-volume irradiations and to ensure compliance with very low cross-section requirements.