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The authors have studied the substrate-induced strain effect in La0.875Ba0.125MnO3 (LBMO) thin films grown on ferroelectric 0.67Pb(Mg1∕3Nb2∕3)O3–0.33PbTiO3 (PMN-PT) single-crystal substrates. Both the strain and resistance of the films can be in situ varied by applying an electric field across the PMN-PT substrates. X-ray diffraction analysis indicates that the variations of strain and resistance result from the induced strain in the PMN-PT substrate due to the ferroelectric polarization or the converse piezoelectric effect. The relationships between the resistance and the induced strain in the LBMO film and PMN-PT substrate have been quantitatively analyzed.
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Zheng et al. (2008) studied this question.
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