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The behavior of a semiconductor contact is usually represented by the specific contact resistance determined by a dc measurement. A copper-gold contact on p-type cadmium telluride is used to illustrate the influence of the ac contact impedance on standard semiconductor measurements such as capacitance versus voltage, admittance spectroscopy, and deep-level transient spectroscopy. These experimental results show that a semiconductor contact with negligible dc voltage drop may have a significant influence on high-frequency, low-temperature, or fast-transient measurements. Knowledge of the contact capacitance as well as the contact resistance is necessary to predict the influence of the contact.
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Shiau et al. (1987) studied this question.
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