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The influence of morphology on the dc conductivity σ dc, the charge carrier density n and the out-of-plane mobilities μ were investigated in conjugated polymer films of poly(3-hexylthiophene) (P3HT) using impedance spectroscopy (IS). IS was used for the first time to discern this information from P3HT films. Values of μ, which were found to be film-thickness dependent, increasing with increasing film thickness, h, for films of thickness h > 700 nm, are in excellent agreement with those measured using time-of-flight (ToF) and the method of charge extraction by linearly increasing voltage (CELIV). Both σ dc and n are shown to decrease appreciably with increasing h . The thickness dependent trends in μ, σ dc and n are consistent with changes in the morphology of these films. Conductive atomic force microscopy (CAFM) provided corroborating information, showing an appreciable dependence of carrier transport on the morphology of P3HT.
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Yang et al. (2013) studied this question.
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