On the relationship between thermal noise and the dielectric response of pyroelectric materials

Both dielectric susceptibility and the dominant thermal noise data at low frequencies are presented for a number of pyroelectric detector materials. The thermal voltage noise measured has a 1/f power spectrum. This behavior is a direct consequence of the fact that the dielectric susceptibility χ(ω) is frequency-independent at sufficiently low frequencies. The connection between 1/f thermal voltage noise and frequency independent χ(ω) in pyroelectric materials is discussed in terms of a recent model that traces their microscopic physical origin.