Effect of Intermediate Annealing on the Structural, Electrical and Dielectric Properties of Zinc Ferrite: An XANES Investigation

In present work we have studied the effect of intermediate annealing (300, 500, 800 and 1000 °C) on the structural, electrical and dielectric properties of zinc ferrite synthesized by a nitrate route. Although structural properties as observed by X-ray diffraction and Raman spectroscopy do not exhibit any change with intermediate annealing, however the dielectric constant as a function of frequency and electrical resistivity as a function of temperature exhibit quiet different behavior for the sample annealed at 1000 °C. Higher resistivity of this sample is due to stronger localization of states at conduction and increase in hole states.