Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
November 1, 1990Journal of the American Ceramic Society

Measurement of Stresses Using Fluorescence in an Optical Microprobe: Stresses around Indentations in a Chromium‐Doped Sapphire

View Full Paper
Ask AI
Bookmark
Share

Authors

SMS. MolisIBM Research - Thomas J. Watson Research CenterDCDavid R. ClarkeUniversity of Pisa

Discussion

Loading...

Member takes

Overview

Key Points

Key points are not available for this paper at this time.

Cite This Study

Molis et al. (1990) studied this question.

synapsesocial.com/papers/6ab35c76ce6161d3ec7232f2https://doi.org/10.1111/j.1151-2916.1990.tb06435.x
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 4 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Raman microprobe and microscope with laser excitation1975 · 455 citations
  2. 2Plastic Deformation of Aluminum Oxide by Indentation and Abrasion1971 · 261 citations
  3. 3Measurement of local stress in laser-recrystallized lateral epitaxial silicon films over silicon dioxide using Raman scattering1983 · 60 citations
  4. 4Spectroscopic technique for the measurement of residual stress in sintered Al2O31978 · 255 citations