A simple and accurate analytical formulation is derived to calculate the value of the resistance of a planar device, between two ohmic contacts deposited for instance on a semiconducting layer. A numerical calculation corroborates the analytical formulae, which also agrees well with experimental measurements. The influence on the resistance value of the electrode length and of the distance between the two contacts, with respect to the active layer thickness, is studied.
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Dansas et al. (1989) studied this question.
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