Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
November 1, 1990Journal of Applied Physics

Direct measurements of compressive and tensile strain during shock breakout by use of subnanosecond x-ray diffraction

View Full Paper
Ask AI
Bookmark
Share

Authors

JWJ. S. WarkUniversity of OxfordDRD. RileyQueen's University BelfastNWN. C. WoolseyUniversity of York

Discussion

Loading...

Member takes

Overview

Key Points

Key points are not available for this paper at this time.

Cite This Study

Wark et al. (1990) studied this question.

synapsesocial.com/papers/6ab473637f5fa3cef2c086c7https://doi.org/10.1063/1.346158
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Shock launching in silicon studied with use of pulsed x-ray diffraction1987 · 68 citations
  2. 2Subnanosecond x-ray diffraction from laser-shocked crystals1989 · 108 citations
  3. 3X. A method of measuring the pressure produced in the detonation of high, explosives or by the impact of bullets1914 · 765 citations
  4. 4Dynamical theory of diffraction applicable to crystals with any kind of small distortion1962 · 754 citations
  5. 5Axial Yield Strengths and Two Successive Phase Transition Stresses for Crystalline Silicon1971 · 122 citations