The resistivity of high purity copper was measured by a method which estimates it by using the difference in the impedance between a circular multilayer solenoid coil with a circular rod-shaped copper sample and a similar coil without a copper sample (SRPM method). The residual resistivity ratio (RRR) of high purity copper measured at 100 Hz by the SRPM method has correlated well with the values measured by the DC four-probe method. It was confirmed that an accurate measurement of the resistivity to 10/sup -12/ Omega m is possible by the SRPM method. Frequency dependence was confirmed to exist in high purity copper with very low resistivity. As the measuring frequency is raised, the decrease in skin depth seems to affect the resistivity.>
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Nakane et al. (1992) studied this question.
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