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The optical characterization of liquid crystals, in a wide spectral range, is becoming a very important technical task because of their expanding applications in displays, optical telecommunications and other advanced areas of science and engineering. One of the most versatile, sensitive, and well‐established technique for the optical characterization of solid and liquid materials is spectroscopic ellipsometry. In this paper, an outline is presented on the use of ellipsometry for nematic liquid‐crystal characterization: anisotropic refractive‐indices measurements and their temperature dependence, anchoring energy, and tilt distribution inside cells will be discussed. The paper is an extended version of a previously published paper.1
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Tkachenko et al. (2010) studied this question.
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