ON-State Reliability of Solid-Electrolyte Switch under Pulsed Alternating Current Stress for Programmable Logic Device

In this paper, we describes the ON-state reliability of a nonvolatile solid-electrolyte switch for a programmable logic device (PLD). The ON-state requirement for this application is different from that of a Cu via or an interconnect, since the pulsed-AC current is applied to the switch when the voltage changes in the interconnect. We experimentally demonstrate a recovering phenomenon in the migration under AC stress and propose an appropriate ON-state resistance of 800 Ω to satisfy the requirement for a current density criterion that goes beyond the 28-nm technology node (hp28). The ON-state duration of the crossbar switch under the pulsed-AC current of 1 GHz is estimated to be over 10 years at an ambient of 150 °C.