Mechanism of Threshold Voltage Shift (ΔVth) Caused by Negative Bias Temperature Instability (NBTI) in Deep Submicron pMOSFETs, Liu, Chuan-Hsi, Lee, Ming T., Lin, Chih-Yung, Chen, Jenkon, Loh, Y. T., Liou, Fu-Tai, Schruefer, Klaus, Katsetos, Anastasios A., Yang, Zhijian, Rovedo, Nivo, Hook, Terence B., Wann, Clement, Chen, Tze-Chiang
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Liu et al. (2002) studied this question.
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