Application determination of single-event transient characteristics in the LM 111 comparator

The effect of an integrated circuit's application can have a profound effect on its single-event transient response. This paper demonstrates how small changes in the application, of which the integrated circuit is a part, can change which devices are sensitive and the critical charge to upset. We show this in a simulation study using an undervoltage detector based on the LM111 voltage comparator. We found three different transistors to be the most sensitive device, depending on the application. When the sensitive transistor changed, the critical charge changed by several orders of magnitude.