An all chemical solution deposition approach for the growth of highly textured CeO2cap layers on La2Zr2O7-buffered long lengths of biaxially textured Ni–W substrates for YBCO-coated conductors

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A reel-to-reel, dip coating process has been developed to continuously deposit epitaxial La 2 Zr 2 O 7 (LZO) and CeO 2 on 5 m long cube-textured {100} (001)Ni tapes. Recent results for La 2 Zr 2 O 7 and CeO 2 buffer layers deposited on long lengths of Ni substrate for the realization of YBa 2 Cu 3 O 7− x (YBCO)-coated conductors are presented. The major achievement is the development of a new all chemical solution deposition (CSD) process leading to the formation of highly textured buffer layers at moderate annealing temperatures. Reproducible highly textured, dense and crack-free LZO buffer layers and CeO 2 cap layers were obtained for annealing temperatures as low as 900 °C in a reducing atmosphere (Ar–5 at.%-H 2 ). The thickness of the LZO buffer layers was determined to be (200 ± 10) nm per single coating; prepared cerium oxide layers showed a thickness of 60 nm ± 10 nm. Pulsed laser deposition (PLD) was used to grow YBCO films on these substrates. A T c 0 of T = 90.5 K and Δ T c = 1.4 K was obtained on PLD-YBCO/CSD-CeO 2 /CSD-LZO/Ni–5 at.% W, which shows the outstanding features of this new buffer layer architecture processed by CSD. The large layer thickness combined with low annealing temperatures is the main advantage of this new process for low-cost buffer layer deposition on Ni-RABiTS (rolling-assisted biaxially textured substrates).