A new instrument for measuring the evolution of index profiles during diffusion in hot (500 degrees C) glass is presented. This instrument, called the oven interferometer, has a spatial resolution of 10 microm at 0.6471 microm and a phase resolution of lambda/50. The development of index profiles with both time-dependent and constant boundary conditions is shown.
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Houde-Walter et al. (1988) studied this question.
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