Cross-sectional Raman spectroscopy was performed on InN epifilms. We found direct evidence for the existence of residual strain along the growth direction of the InN films. This result is very useful for the understanding of the depth dependence of the physical properties. We also found that cross-sectional Raman spectroscopy can be used to study certain vibration modes that are normally not observable in the normal surface Raman configuration.
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Chen et al. (2005) studied this question.