Thin samples in spectroscopy often show disturbing channel spectra due to interference fringes produced by reflections at the sample surface. These fringes will be characterized by a set of peak wavenumbers, vm as Vm = m/2nd (1) where m = 0, 1, 2, ... ; n is the sample refractive index, and d, its thickness. The intensity of these peaks, ΔT, is given by ΔT = 4 (n − 1/n + 1)2 (2) for thin film solid samples and ΔT = 4 (n − n0/n + n0)2 (3) for samples contained between windows of index n0.
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Hirschfeld et al. (1976) studied this question.