N-type Si cells offer a compelling alternative to p-type cells to achieve high, stabilized cell efficiencies because they do not suffer from light-induced degradation. However, the most common dielectric materials that are used to passivate the n+emitters of p-type cells-thermal SiO2and SiNX-have historically provided poor passivation of the p+emitters required for n-type cells. In this paper, we demonstrate that a thin thermal-SiO2/SiNXstack can, when appropriately fired, provide similar passivation on both p+and n+surfaces. Passivation studies on textured, SiO2/SiNXpassivated p+-Si surfaces indicate that a high-temperature firing cycle is the most important step to achieving high-quality passivation and that the positive charge in the dielectric stack may have little detrimental effect on industrial-type, high surface concentration emitters. In addition, the suitability of spin-on boric acid sources for forming uniform, well-passivated p+emitters on textured surfaces was studied. This passivation scheme and spin-on boron source were used to achieve 4-cm2screen-printed n-type cells with efficiencies over 20% and open-circuit voltages up to 650 mV.
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Das et al. (2011) studied this question.
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