Imaging of sub-unit-cell structures in the contact mode of the scanning force microscope

An experimental and theoretical study on the nature of the movement of a scanned tip on a β-MoTe₂ surface is presented, which examines the consequences of the applied loading force on the resolution of sub-unit-cell structures of a scanning force microscope operated in contact mode. By comparison of experimental and simulated force maps it is found that the so-called ``stick-slip'' movement of the tip depends strongly on the applied loading force. This effect has significant consequences on the resolution of the examined nontrivial unit cell of β-MoTe₂.