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Secondary fluorescence effects are calculated and compared with the total fluorescence for multiple‐layer thin‐film samples of Fe, Ni and Fe, Ni, Cu, Cr. The ratio of secondary to total fluorescence for a given analyte is found to be greater in the system where the enhancer is in a layer which is closer to the surface. Secondary fluorescence effects are calculated for a Ni thin film on an Sn sample. Unusual acquisition conditions cause the intensity from the Ni thin film layer to exceed the intensity from a bulk sample of Ni.
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James E. Willis (1989) studied this question.
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