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Miniaturization of displacement sensors for nanoscale metrology is a key requirement in many applications such as accelerometry, mass sensing, and atomic force microscopy. While optics provides high resolution and bandwidth, integration of sensor readout is required to achieve low-cost, compact, and parallelizable devices. Here, we present a novel integrated opto-electro-mechanical device for displacement sensing that has sub-nanometer resolution. The proposed sensor is a micron-sized double-membrane photonic crystal cavity with integrated electro-optical readout, directly addressed via an on-chip waveguide. This sensor displays a noise floor down to 7 fm/Hz and is suitable for the realization of integrated arrays.
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Galeotti et al. (2020) studied this question.
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