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November 1, 2018Journal of Applied Crystallography

X-ray topo-tomography studies of linear dislocations in silicon single crystals

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Authors

ВАВ. Е. АсадчиковABAlexey V. BuzmakovFCF. N. Chukhovskiǐ

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Асадчиков et al. (2018) studied this question.

synapsesocial.com/papers/6ab8bea073418b623bf92778https://doi.org/10.1107/s160057671801419x
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