This paper describes a new statistical method of lifetime estimation of a solid electrical insulation using data from an accelerated aging test. The method simultaneously uses the maximum likelihood estimation and the Newton-Raphson methods. The novel aspect of this work is the introduction of a new threshold term in addition to well-known estimation techniques based on the inverse power model combined with the Weibull distribution. Thus, we can estimate the threshold value with a confidence interval. In order to reduce time and costs of voltage-lifetime test5, an accelerated testing procedure with type I censoring is considered.
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Hideo Hirose (1987) studied this question.
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