Achieving reliable imaging under adverse environmental conditions, such as fog, haze, and low visibility, is essential for applications in autonomous driving, surveillance, and machine vision. Visible‐blind near‐infrared (NIR) organic photodetectors (OPDs) present a compelling solution by enhancing NIR detection while suppressing interference from ambient visible light. However, balancing strong visible‐light attenuation with high NIR sensitivity remains a significant challenge. In this work, we introduce a high‐performance visible‐blind NIR OPD with a multilayer GaP/MgF 2 /ZnSe optical modulation layer (OML) optimized through high‐throughput optical screening. This design synergistically delivers both strong visible‐light attenuation and pronounced NIR enhancement, enabling OPDs to achieve a responsivity of 0.32 A/W and a specific detectivity of 6.79 × 10 12 Jones at 1050 nm under −1.0 V, accompanied by significantly improved spectral selectivity. Monolithic integration of a 64 × 64 OPD array with a thin‐film transistor backplane yields a vision sensor capable of high‐contrast NIR imaging and pattern recognition even in foggy or low‐light conditions. This OML‐enabled visible‐blind NIR OPD strategy establishes a scalable and reliable platform for advanced machine vision, with strong potential for next‐generation environmental monitoring, autonomous vehicles, and security systems.
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Deng et al. (2026) studied this question.
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