The oxidation states of chromium dissolved in binary sodium silicate glasses were analyzed by X‐ray photoelectron spectroscopy (XPS). The measured “equilibrium” Cr 6+ fractions in glasses with varying Na 2 O contents are shown to be in good agreement with results obtained by other techniques reported in the literature. XPS was then used to analyze the interface of a sodium silicate glass/chromium alloy (Inconel 718) seal. It is shown that Cr 2+ and Cr 3+ were the major chromium species dissolved in the glass interfacial region.
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Richard K. Brow (1987) studied this question.
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