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March 1, 2005Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

Ion-beam morphological conditioning of carbon field emission cathode surfaces

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Authors

CHCharles E. HuntUniversity of California, DavisACA.G. ChakhovskoiUniversity of California, DavisYWYu WangGoethe University Frankfurt

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Hunt et al. (2005) studied this question.

synapsesocial.com/papers/6abe5ca8847d71e5b06e1b05https://doi.org/10.1116/1.1880052
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