Binary phase shifting profilometry

Fringe projection profilometry offers the advantages of non-contact measurement, high precision, and strong resolution, and has been widely applied in industrial inspection, virtual reality, and other fields. However, under sinusoidal fringe coding, the projection speed of digital micromirror devices imposes a constraint, making it difficult to further improve measurement speed while ensuring accuracy. To address this limitation, this paper proposes a binary phase-shifting profilometry method. From the perspective of phase-sensitive detection, a universal phase demodulation model suitable for binary fringe coding is established, and two types of spatially unambiguous binary phase coding schemes without lens defocusing are designed. Experimental results show that the proposed binary coding method achieves higher accuracy and offers remarkable advantages in speed enhancement, making it a promising alternative to conventional fringe projection profilometry in future applications.