Quantum Algorithm Performance Under Noise: A Qiskit Aer Simulation Study and IBM Quantum Hardware Comparative Analysis

This study examines how noise affects the reliability of quantum circuits through two complementary approaches: a controlled simulation using Qiskit Aer and an execution study on real IBM Quantum hardware. In simulation, five noise models (bit-flip, phase-flip, depolarizing, readout, and thermal-relaxation) were applied to a parameterized benchmark circuit across varying qubit counts, circuit depths, and noise strengths, producing 6,000 experimental observations. Success probability declined substantially as qubit count and circuit depth increased, with bit-flip, phase-flip, and depolarizing noise degrading performance far more severely (mean success probabilities of 0.597, 0.580, and 0.607) than readout noise (0.917) or thermal-relaxation noise (0.982). The same benchmark circuit was then executed on the ibm_marrakesh processor across 150 hardware runs (150,000 shots). Hardware performance remained consistently high (mean success probability 0.992), declining with qubit count (0.998 at two qubits to 0.986 at six) but showing little sensitivity to circuit depth. These results indicate that controlled noise mechanisms and real hardware degrade circuit performance through different dynamics, with implications for interpreting simulated noise models relative to physical device behavior.