Spatial Resolutions and Polarization Analysis in Raman Microprobe Technique

The spatial resolutions and polarization analysis in the Raman microprobe technique were dealt with. The spatial resolutions for the axial and the horizontal directions of high-numerical-aperture objectives in vacuum were estimated theoretically by the analysis of the spatial distribution of the incident electric field near the focal point. Based on the results, a method of correction for the polarization scrambling effect caused by the sharp focusing objective in the polarization analysis, which is a modification of the method derived by Turrell, was derived. This was applied successfully to the analysis of spectral change due to the shift of the focus in a specimen such as α-quartz.