Atomic resolution HVEM and environmental noise

After 3 years, an advanced transmission electron microscope (ARHVTEM) was finely tuned. Environmental mechanical vibration causing serious disturbance for atomic-resolution observation was effectively damped by an air spring suspension system. Stray magnetic fields from the subway running 250 m away were found to degrade the resolution of the microscope fatally. The designed resolution was recovered by producing a counter field around the objective lens by a three-dimensional electromagnetic coil. For α-SiC, viewed along <12¯0>, each atomic column of silicon and carbon presented distinct atomic image contrast. In diamond, viewed along <110>, the ‘dumbbell image’ of close atomic columns which are separated by 0.098 nm was resolved.