We report on micro-Raman spectroscopy studies of porous silicon which show an amorphous silicon Raman line at 480 R cm−1 from regions that emit visible photoluminescence. A Raman line corresponding to microcrystalline silicon at 510 R cm−1 is also observed. X-ray photoelectron spectroscopy data is presented which shows a high silicon-dioxide content in porous silicon consistent with an amorphous silicon phase.
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Pérez et al. (1992) studied this question.
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