Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
May 16, 1988Applied Physics Letters

Experimental determination of the nanocrystalline volume fraction in silicon thin films from Raman spectroscopy

View Full Paper
Ask AI
Bookmark
Share

Authors

EBE. BustarretMHM.A. HachichaMBM. Brunel

Discussion

Loading...

Member takes

Overview

Key Points

Key points are not available for this paper at this time.

Cite This Study

Bustarret et al. (1988) studied this question.

synapsesocial.com/papers/6a70eda4a528af2d65c3d17dhttps://doi.org/10.1063/1.99054
View Full Paper
Ask AI
Bookmark
Share