Monte Carlo Study of the Shift of the Critical Temperature in Ferroelectric Films

The paper presents the results of computer simulation of the change in the phase transition temperature in a thin ferroelectric film using modified Ising-like models, considering the influence of the substrate and electrodes. It was shown that one of the dominant factors that most strongly affect the phase transition in such films is deformation caused by mismatches in the coefficients of thermal expansion of the film, its substrate, and the electrodes.