The characteristics of an acceptor level in Sb-doped, p-type ZnO were studied using cathodoluminescence (CL) spectroscopy as a function of hole concentration. Variable-temperature CL measurements allowed us to estimate the activation energy of an Sb-related acceptor from temperature-induced decay of CL intensity. The values of activation energy of about 212±28, 175±20, 158±22, and 135±15meV were obtained for samples with carrier concentrations of 1.3×1017, 6.0×1017, 8.2×1017, and 1.3×1018cm−3, respectively. The involvement of acceptor levels is supported by the temperature-dependent hole concentration measurements. The possible origins of the strong temperature dependence are discussed.
No takes yet. Share an insight, caveat, or question.
Lopatiuk‐Tirpak et al. (2006) studied this question.
Synapse has enriched 5 related papers. Consider them for comparative context: